C.C. Wei

机构：Yanshan University

发表论文 19 篇 · 总被引 409 次 · h-index 9

代表论文

• Single-transistor latch in SOI MOSFETs (1988 · IEEE Electron Device Letters · 被引 197)
• Hot-carrier induced electron mobility and series resistance degradation in LDD NMOSFET's (1994 · IEEE Electron Device Letters · 被引 48)
• 0.5 micron CMOS for high performance at 3.3 V (2003 · 被引 47)
• An 0.8µm CMOS technology for high performance logic applications (1987 · 被引 36)
• An 8 ns BiCMOS 1 Mb ECL SRAM with a configurable memory array size (2003 · 被引 27)
• Planarized aluminum metallization for sub-0.5 mu m CMOS technology (2002 · 被引 15)