Deng Luo

机构：University of Electronic Science and Technology of China · ORCID：0000-0003-0475-8268

发表论文 66 篇 · 总被引 779 次 · h-index 11

代表论文

• High-Frequency Three-Level Gate Driver for GaN HEMT Bridge Crosstalk Suppression (2023 · IEEE Transactions on Power Electronics · 被引 17)
• Enhanced Total Ionizing Dose Response of 16 nm n-FinFETs With a Single Fin (2023 · IEEE Electron Device Letters · 被引 13)
• Revealing the Effect of α’ Decomposition on Microstructure Evolution and Mechanical Properties in Ti80 Alloy (2024 · Materials · 被引 8)
• Higher NMOS Single Event Transient Susceptibility Compared to PMOS in Sub-20nm Bulk FinFET (2023 · IEEE Electron Device Letters · 被引 8)
• Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering Technique (2024 · IEEE Transactions on Nuclear Science · 被引 7)
• A 0.024mm 2 All-Digital Fractional Output Divider with 257fs Worst-Case Jitter Using Split-DTC-Based Background Calibration (2025 · 被引 6)