Yongkang Xue

机构：Shanghai Jiao Tong University · ORCID：0000-0003-4542-5566

发表论文 35 篇 · 总被引 187 次 · h-index 8

代表论文

A strong physical unclonable function with machine learning immunity for Internet of Things application (2023 · Science China Information Sciences · 被引 12)
New Insights into the Interface Trap Generation during Hot Carrier Degradation: Impacts of Full-band Electronic Resonance, (100) vs (110), and nMOS vs pMOS (2023 · 被引 12)
Toward Reliability- and Variability-Aware Design-Technology Co-Optimization in Advanced Nodes: Defect Characterization, Industry-Friendly Modeling, and ML-Assisted Prediction (2023 · IEEE Transactions on Electron Devices · 被引 11)
Self-Heating Effects of Vertical Gate-All-Around Transistors: Analysis and Modeling (2024 · IEEE Transactions on Electron Devices · 被引 9)
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes (2024 · 被引 9)
A Device-Circuit Aging Simulation Framework Integrating Trap-Based Models and Sensitivity Analysis for FinFET Technology (2023 · IEEE Transactions on Electron Devices · 被引 8)