Baokang Peng

机构：Peking University, Peking University Shenzhen Hospital, Shandong University of Science and Technology · ORCID：0000-0002-9778-4184

发表论文 31 篇 · 总被引 130 次 · h-index 8

代表论文

New Insights into the Interface Trap Generation during Hot Carrier Degradation: Impacts of Full-band Electronic Resonance, (100) vs (110), and nMOS vs pMOS (2023 · 被引 12)
Statistical Compact Modeling With Artificial Neural Networks (2023 · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 被引 12)
Self-Heating Effects of Vertical Gate-All-Around Transistors: Analysis and Modeling (2024 · IEEE Transactions on Electron Devices · 被引 9)
Modeling the Parasitic Resistances and Capacitances of Advanced Vertical Gate-All-Around Transistors (2023 · IEEE Transactions on Electron Devices · 被引 9)
Benchmarking Artificial Neural Network Models for Design Technology Co-optimization (2023 · 被引 8)
Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET (2024 · 被引 6)