Eugen Schwan

机构：Corrected Electron Optical Systems (Germany)

发表论文 6 篇 · 总被引 1651 次 · h-index 5

代表论文

Electron microscopy image enhanced (1998 · Nature · 被引 1065)
A spherical-aberration-corrected 200kV transmission electron microscope (1998 · Ultramicroscopy · 被引 430)
Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-corrector (1995 · Optik · 被引 122)
First application of a spherical‐aberration corrected transmission electron microscope in materials science (2002 · Journal of Electron Microscopy · 被引 28)
Benefits of a Cs-Corrector for Material Science (2001 · Microscopy and Microanalysis · 被引 6)
First Application of a Spherical-Aberration Corrected Microscope Material Science (1998 · Microscopy and Microanalysis · 被引 1)