Data used in: Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001)

作者：Hao Yin, Fumihiko Matsui, Tien-Lin Lee, Susanne Wolff, Niclas Tilgner, Monja Stettner, Serguei Soubatch, F. Stefan Tautz, François C. Bocquet, Christian Kumpf · 发表于：Jülich DATA · 年份：2026 · DOI：10.26165/juelich-data/jnjom7 · 研究领域：Materials science、Optoelectronics、Optics、Nanotechnology

It contains the obtained raw data by low energy electron microscopy (LEEM), normal incident x-ray standing wave (NIXSW) data, and Angle-resolved Photoemission Spectroscopy (ARPES). The LEEM data are stored in the type of TIF (.tiff), and each TIF file is an image-sequence of LEEM.