Implementation of depth-resolved Laue microdiffraction by wire profiling at the Shanghai Synchrotron Radiation Facility

作者：You-Kang Wang, Yiming Yang, Run-guang Li, Dong-Hai Yu, Si-Sheng Wang, Zhi-Jun Wang, Peng Liu, Yan-Dong Wang · 发表于：Journal of Applied Crystallography · 年份：2026 · DOI：10.1107/s1600576726004073 · 研究领域：Advanced X-ray Imaging Techniques、Crystallography and Radiation Phenomena、Advanced Electron Microscopy Techniques and Applications

White-beam X-ray microdiffraction is a non-destructive technique for probing microstructure and micromechanical behavior on the mesoscopic scale. Making use of the high throughput of Laue diffraction and advanced X-ray focusing optics, this technique enables efficient point-by-point mapping of local crystal structure, lattice rotation and elastic strain with submicrometre spatial resolution. However, the deep penetration of X-rays leads to a signal averaging effect along the beam path in bulk materials, which severely restricts further application of conventional microdiffraction. Herein, we report the successful implementation of differential aperture X-ray microscopy on the standard Laue microdiffraction beamline (BL03HB) at the Shanghai Synchrotron Radiation Facility, China. Using a step-scanned absorbing wire as a depth profiler for diffracted beams, the beamline is endowed with depth-resolved analytical capability. We have also developed an efficient geometric parameter calibration method and screened a robust optimization algorithm for diffraction signal depth reconstruction via forward simulations. This implementation enabled the acquisition of depth-resolved crystallographic information from a bulk silicon bimorph and a nickel-based single-crystal superalloy, with a depth resolution of <10 µm. These results lay a solid foundation for expanding the beamline's characterization capability from two-dimensional surface analysis to three-dimensional volumetric mapping of...