High-throughput X-ray total scattering measurement system at BL04B2 of SPring-8

作者：Hiroki Yamada, Seiya Shimono, Shogo Kawaguchi, Koji Ohara, Kei Watanabe, Michitaka Takemoto, Jo-Chi Tseng, Masakuni Takahashi, Yuki Sada, H Yamazaki, H Ohashi, Yasuhiko Imai, Takaki Hatsui, Ichiro Inoue, Shigeru Kimura, K. Sugimoto, Makina Yabashi, Osami Sakata, Yuji Higo, Kenji Tamasaku · 发表于：Journal of Synchrotron Radiation · 年份：2026 · DOI：10.1107/s1600577525011294 · 被引用次数：2 · 研究领域：X-ray Diffraction in Crystallography、Radiation Shielding Materials Analysis、X-ray Spectroscopy and Fluorescence Analysis

X-ray total scattering is widely used for analyzing pair distribution functions (PDFs) to elucidate the local structure of materials. For achieving high-throughput PDF analysis, a beamline monochromator and an experimental system were updated at BL04B2 of SPring-8. The system consists of a diffractometer and 2D area detectors, which cover a wide Q range of 0.2–27 Å −1 at a photon energy of 113 keV, with a temperature control capability between 100 and 1100 K. The typical measurement time is reduced to ∼10 min per sample, which is more than ten times faster than the conventional setup. This system enables efficient structural analysis of various types of materials such as liquids, glasses and nanocrystals while yielding abundant measurement data for use in materials science.