Analog circuit test point selection method for fault diagnosis based on deep reinforcement learning

作者：Haochi Yang, Xiaodong Liu, Tianyu Gao, Jingli Yang · 发表于：Engineering Applications of Artificial Intelligence · 年份：2025 · DOI：10.1016/j.engappai.2025.113294 · 被引用次数：5 · 研究领域：VLSI and Analog Circuit Testing、VLSI and FPGA Design Techniques、Low-power high-performance VLSI design