Thermally activated homologous defect engineering for ultra-stable ultrahigh-nickel cathodes via self-driven short-range disorder

作者：Sida Huo, Ben Su, Lei Chai, Yue Wang, Wang Li, M. Qi, Tingrun Lai, Zichen Liu, Meng Li, Anbin Zhou, Jingyi Qiu, Wendong Xue, Hong Xu, Xiangming He · 发表于：Energy storage materials · 年份：2025 · DOI：10.1016/j.ensm.2025.104750 · 被引用次数：8 · 研究领域：Advancements in Battery Materials、Advanced Battery Materials and Technologies、Supercapacitor Materials and Fabrication