Highly Sensitive MXene/Si X-Ray Detector via Graphene Interfacial Engineering

作者：Yance Chen, Xuan Ye, Muhammad Abid Anwar, Xin Ming, Wenbo Zhao, Jian Chai, Xiaochen Wang, Yunfei Xie, Wenzhang Fang, Srikrishna Chanakya Bodepudi, Chao Gao, Yang Xu · 年份：2025 · DOI：10.1109/esserc66193.2025.11214089 · 被引用次数：3 · 研究领域：MXene and MAX Phase Materials、Graphene research and applications、Radiation Detection and Scintillator Technologies

Developing compact, low-dose X-ray detectors demands novel material integration strategies to enhance sensitivity and scalability. While emerging materials like MXenes offer advantages over conventional perovskites in environmental stability and carrier transport, their interfacial dynamics with semiconductors remain a critical performance bottleneck. Here, we report a$\text{Ti}_{3} \mathrm{C}_{2} \mathrm{T}_{\mathrm{x}}$MXene/Si X-ray detector with a graphene-engineered heterointerface that achieves outstanding performance metrics. By inserting a monolayer graphene between MXene and silicon, we suppress dark current by two orders of magnitude while doubling photocurrent under X-ray irradiation$(20 \text{keV}, 1.62 \mu \text{Gy}_{\text{air }} \mathrm{s}^{-1})$, yielding a record sensitivity of$2.5 \times 10^{6} \mu \mathrm{C} \text{Gy}_{\text{air }}{ }^{-1} \text{cm}^{-2}$. The optimized device demonstrates ultra-low noise spectral density$\left(1.6 \times 10^{-26} \mathrm{A}^{2} \cdot \text{Hz}{ }^{-}\right. { }^{1})$and limit of detection$(1.27 \text{nGy}_{\text{air }} \mathrm{s}^{-1})$, and rapid response speed$(38 \mu \mathrm{s})$. Leveraging a single-pixel imaging system with Hadamard modulation and iterative reconstruction algorithms (ISTA), we validate high-resolution radiography capabilities. Crucially, the van der Waals-integrated MXene/graphene/Si architecture, enabling scalable fabrication with low-dose and high-speed X-ray detection. This interfacial engineering s...