WamGLM: A multimodal large-scale language model for wafer map defect information in-depth query through multi-turn dialogue based on prototypical supervised contrastive learning

作者：Shulong Gu, Zihao Lei, Guangrui Wen, Quanning Xu, Zhaojun Li, Xuefeng Chen, Chunsheng Yang · 发表于：Applied Soft Computing · 年份：2025 · DOI：10.1016/j.asoc.2025.113962 · 被引用次数：4 · 研究领域：Industrial Vision Systems and Defect Detection、Manufacturing Process and Optimization、Non-Destructive Testing Techniques