A Method of Redundant Feature Suppression in Circuit Output Positions for Analog Circuit Soft and Hard Fault Diagnosis

作者：Zhijun Yue, Lingfeng He, Jin He, Guanci Yang, Yi Yang, Y. An · 发表于：Journal of Electronic Testing · 年份：2025 · DOI：10.1007/s10836-025-06187-1 · 被引用次数：2 · 研究领域：Integrated Circuits and Semiconductor Failure Analysis、VLSI and Analog Circuit Testing、Fault Detection and Control Systems