DDEG: Addressing data scarcity in additive manufacturing defect detection through joint generation of CT images and defect annotations

作者：Rui Han, Yu‐Zhong Wang, Wenhua Guo, Chenwei Wang, Yihui Zhang, Yanyang Zi, Jiyuan Zhao · 发表于：Advanced Engineering Informatics · 年份：2025 · DOI：10.1016/j.aei.2025.103619 · 被引用次数：10 · 研究领域：Additive Manufacturing Materials and Processes、Image Processing and 3D Reconstruction、Advanced X-ray and CT Imaging