LLM-Powered Test Case Generation for Detecting Bugs in Plausible Programs

作者：Kaibo Liu, Zhenpeng Chen, Yiyang Liu, Jie M. Zhang, Mark Harman, Yudong Han, Yun Ma, Yihong Dong, Ge Li, Gang Huang · 年份：2025 · DOI：10.18653/v1/2025.acl-long.20 · 被引用次数：7 · 研究领域：Radiation Effects in Electronics、Software Testing and Debugging Techniques、Electrostatic Discharge in Electronics

Kaibo Liu, Zhenpeng Chen, Yiyang Liu, Jie M. Zhang, Mark Harman, Yudong Han, Yun Ma, Yihong Dong, Ge Li, Gang Huang. Proceedings of the 63rd Annual Meeting of the Association for Computational Linguistics (Volume 1: Long Papers). 2025.