Origin and suppression of structural degradation in Ni-rich layered oxide cathodes at elevated temperatures

作者：Yangyang Wang, Chaofan Li, Huiling Guo, Shabir Ahmad, Wasif ur Rehman, Pan Zhang, Chunmei Ban, Xueping Gao · 发表于：Energy storage materials · 年份：2025 · DOI：10.1016/j.ensm.2025.104413 · 被引用次数：8 · 研究领域：Advancements in Battery Materials、Semiconductor materials and devices、Transition Metal Oxide Nanomaterials