Coded-mask-based wavefront sensing technique for APS nanofocusing beamline diagnostics

作者：Xianbo Shi, Zhi Qiao, Matthew J. Highland, Matthew G. Frith, Luca Rebuffi, Michael Wojcik, Lahsen Assoufid · 发表于：Review of Scientific Instruments · 年份：2025 · DOI：10.1063/5.0256447 · 被引用次数：1 · 研究领域：Advanced X-ray Imaging Techniques、Advanced X-ray and CT Imaging、Advanced Optical Sensing Technologies

We extend our recently developed coded-mask wavefront sensing technique to enable single-shot measurements of nanofocused x-ray beams. This method accurately reconstructs the focal beam profile by backpropagating the wavefront measured downstream of the beam focus. To validate its performance, we benchmarked it against the conventional fluorescence wire scan method, successfully measuring ∼120 nm focal spots at the 28-ID-B beamline of the Advanced Photon Source using a polymeric compound refractive lens. The results highlight the effectiveness of coded-mask wavefront sensing for high-precision beam profiling and its application as a real-time wavefront monitoring tool.