Remaining useful life prediction of DC contactor based on LSTM

作者：Yu Wang, Yong Jun Xie, Huimin Liang, Hongyue Ma · 发表于：Microelectronics Reliability · 年份：2025 · DOI：10.1016/j.microrel.2025.115815 · 被引用次数：4 · 研究领域：Non-Destructive Testing Techniques、Machine Fault Diagnosis Techniques、Industrial Vision Systems and Defect Detection