Interplays between TM migration, cation mixing and oxygen defects and their impacts on degradation of layer-structured oxide cathode materials

作者：Shuwei Li, Yixin Li, Zhenjie Zhang, Xi Shen, Hongxiang Ji, Zepeng Liu, Zilin Hu, Haibo Wang, Haibo Wang, Zhiwei Hu, Hao Yu, Zhiwei Hu, Shu‐Chih Haw, Chien‐Te Chen, Qingyu Kong, Yurui Gao, Xuefeng Wang, Richeng Yu, Zhaoxiang Wang, Liquan Chen · 发表于：Energy storage materials · 年份：2025 · DOI：10.1016/j.ensm.2025.104337 · 被引用次数：15 · 研究领域：Advancements in Battery Materials、Semiconductor materials and devices、Electronic and Structural Properties of Oxides