Investigation of nanoscale surface roughness, fractal growth, optical constant and dispersion parameters of rf-sputtered CdS thin films for high-performance metal–semiconductor photodetector

作者：Sakshi Pathak, Shristi Chaudhary, Monika Shrivastav, J. S. Yadav, Shivam Shukla, Ştefan Ţălu, Naveen Kumar, Fernando Guzman, Sanjeev Kumar, Chandra Kumar · 发表于：Optical and Quantum Electronics · 年份：2025 · DOI：10.1007/s11082-025-08244-7 · 被引用次数：5 · 研究领域：Surface Roughness and Optical Measurements、Advanced Semiconductor Detectors and Materials、Quantum Dots Synthesis And Properties