Evaluation of random process fluctuation and geometry dependence in nanosheet reconfigurable transistor

作者：Chao Wang, Jianing Zhang, Ziyu Liu, Xiaojin Li, Yanling Shi, Shaoqiang Chen, Fei Lu, Xinyu Dong, Yang Shen, Yabin Sun · 发表于：Micro and Nanostructures · 年份：2025 · DOI：10.1016/j.micrna.2025.208097 · 被引用次数：3 · 研究领域：Advancements in Semiconductor Devices and Circuit Design、Semiconductor materials and devices、Integrated Circuits and Semiconductor Failure Analysis