Physics-informed neural network supported wiener process for degradation modeling and reliability prediction

作者：Zhongze He, Shaoping Wang, Jian Shi, Di Liu, Xiaochuan Duan, Yaoxing Shang · 发表于：Reliability Engineering & System Safety · 年份：2025 · DOI：10.1016/j.ress.2025.110906 · 被引用次数：56 · 研究领域：Probabilistic and Robust Engineering Design、Non-Destructive Testing Techniques、Integrated Circuits and Semiconductor Failure Analysis