Characterization of Field-Exposed Photovoltaic Modules Featuring Signs of Contact Degradation

作者：Max Liggett, Dylan J. Colvin, Andrew Ballen, Manjunath Matam, Hubert Seigneur, Mengjie Li, Andrew M. Gabor, Philip J. Knodle, Craig J. Neal, Sudipta Seal, Daniel Riley, Bruce H. King, Michael Peter, Laura S. Bruckman, Roger H. French, Kristopher O. Davis · 发表于：IEEE Journal of Photovoltaics · 年份：2025 · DOI：10.1109/jphotov.2025.3531052 · 被引用次数：4 · 研究领域：Photovoltaic Systems and Sustainability、Silicon and Solar Cell Technologies、solar cell performance optimization

This work investigates several photovoltaic (PV) modules that have shown signs of metal contact corrosion due to field exposure in a hot and humid climate. This includes two multicrystalline silicon aluminum back surface field systems with 10 and 14 years of exposure and one monocrystalline silicon passivated emitter and rear cell system with four years of exposure. A comprehensive, multiscale characterization process is used to evaluate these PV modules in great detail. Current–voltage ($I-V$), Suns-$V_{\text{OC}}$measurements, electroluminescence imaging, infrared imaging, and ultraviolet fluorescence imaging were performed, and locations of interest were cored and analyzed using cross-sectional scanning electron microscopy (SEM). A rigorous, quantitative analysis procedure for the cross-sectional SEM images is proposed and implemented. Careful characterization does reveal that some of these PV modules do indeed exhibit the same classic signs of acetic-acid-based corrosion of the glass frit that is present at the silver/silicon interface, which have been observed previously in PV modules exposed to damp heat in an environmental chamber.