Expediting Manufacturing Launch Using Integrated Data With AI/ML Analytic Solutions

作者：Helen Yu, Scott D. Martin, Laurenz van der Meer, Edward Yang, Sherry Lee, Wanting Xiong, Vaishnavi Reddipalli, R. Burch, Tomonori Honda, Jeffrey David · 发表于：IEEE Journal of the Electron Devices Society · 年份：2024 · DOI：10.1109/jeds.2024.3522126 · 被引用次数：1 · 研究领域：Manufacturing Process and Optimization

Manufacturing yield, test time and quality are important metrics in new product introduction (NPI) to manufacturing safe launch. A powerful yield management system is crucial to achieve the goal metrics. In this paper, recommended yield management system selection criteria, data integration and machine learning (ML) methodologies along with innovative ways of using the selected yield management system to benefit safe manufacturing launch efficiency are introduced. Three examples of using a cloud yield tool including ML capabilities to expedite yield learning, test time reduction (TTR) and quality enhancement are presented.