Simulation Method for Reliability Prediction of Switching Power Supply injected with PoF Model

作者：Kaiwen Xiao, Cen Chen, Weiming Liu, Shujuan Wang, Xiaoying Gao, Guofu Zhai · 年份：2024 · DOI：10.1109/srse63568.2024.10772540 · 被引用次数：2 · 研究领域：Industrial Technology and Control Systems、Power Systems and Technologies、Smart Grid and Power Systems

Switching power supplies are widely used in aerospace, new energy and many other fields. During long-term operation, various electronic components in these supplies experience performance degradation due to continuous electrical and thermal stress, leading to changes in output characteristics. This is the fundamental reason affecting the reliability of switching power supplies. However, the current combination of physics of failure (PoF) models and simulation technique is imperfect, and most methods cannot achieve batch injection of multiple device failures. This paper proposes a reliability prediction simulation method for switching power supplies based on PoF model injection. By focusing on a switching circuit, the approach involves digital twin modeling and validation, failure mechanism and sensitivity analysis, key failure components degradation modeling, and batch degradation simulation. This method achieves continuous degradation data of multiple components based on the PoF model through batch injection, improving the efficiency and accuracy of reliability prediction for switching power supplies.