Comprehensive analysis of beryllium content influence on secondary electron yield in Cu Be alloys

作者：Can Wang, Daibo Zhu, Wenming Zhu, Hailin Liu, Xinyan Liu, Xiaoyu Jiang, Fan Zhou, Yanbin Jiang, Xiaochen Ding, Tao Deng · 发表于：Materials Characterization · 年份：2024 · DOI：10.1016/j.matchar.2024.114553 · 被引用次数：8 · 研究领域：Electron and X-Ray Spectroscopy Techniques、Semiconductor materials and interfaces、Intermetallics and Advanced Alloy Properties