PFEI-Net: A profound feature exploration and interaction network for ceramic substrate surface defect detection

作者：Y G He, Chunming Cai, Gui Chen, Jiarong Hu, Jiarong Hu, Jianzhong Fu, Jianzhong Fu · 发表于：Expert Systems with Applications · 年份：2024 · DOI：10.1016/j.eswa.2024.125741 · 被引用次数：11 · 研究领域：Industrial Vision Systems and Defect Detection、Advanced Neural Network Applications、3D Surveying and Cultural Heritage