Sb-anchoring single-crystal engineering enables ultra-high-Ni layered oxides with high-voltage tolerance and long-cycle stability

作者：Zhuolin Yang, Zhikun Zhao, Xinyu Zhang, Shijie Lu, Yuxiang Zhang, Qi Liu, Feng Wu, Guoqiang Tan, Daobin Mu · 发表于：Nano Energy · 年份：2024 · DOI：10.1016/j.nanoen.2024.110413 · 被引用次数：23 · 研究领域：Semiconductor materials and devices、Electronic and Structural Properties of Oxides、Advancements in Battery Materials