Corrosion and conductivity damage of AgNW transparent conductive thin films under a simulated sulfur-containing atmosphere and mechanical force

作者：Shan Wan, Tingting Wen, Bokai Liao, Xingpeng Guo · 发表于：Microelectronics Reliability · 年份：2024 · DOI：10.1016/j.microrel.2024.115516 · 被引用次数：4 · 研究领域：Nanomaterials and Printing Technologies、Advanced Sensor and Energy Harvesting Materials、Electronic Packaging and Soldering Technologies