Ion migration in p-type perovskite MAPbI 3 films under an electric field and thin-film transistor device failure

作者：J. Su, Zhenxin Yang, Xuanhe Li, Fushun Li, Juntao Hu, Nan Chen, Tao Zhang, Dengke Wang, Zheng‐Hong Lu, Qiang Zhu · 发表于：Chemical Communications · 年份：2024 · DOI：10.1039/d4cc03446e · 被引用次数：5 · 研究领域：Perovskite Materials and Applications、Conducting polymers and applications、Semiconductor materials and devices

Ion migration in MAPbI 3 films and subsequent electrochemical material decomposition under voltage bias was investigated through dynamic analysis on morphology, chemical states, and electrical properties.