An investigation of the electrical contact failure of JPT electric connectors used in automobiles under multiple stresses

作者：Xin‐long Liu, Shao-xiong Hu, Qian Xiao, Guohong Deng, Yi-ting Zheng, Ming-sheng Gao, Dan Zhang, Haiyang Cao, Ze Wang, Daoyun Chen, Wenbin Yang · 发表于：Wear · 年份：2024 · DOI：10.1016/j.wear.2024.205458 · 被引用次数：18 · 研究领域：Electrical Contact Performance and Analysis、Electronic Packaging and Soldering Technologies、3D IC and TSV technologies