Expediting manufacturing safe launch with Big Data AI/ML analytic solutions on the cloud

作者：Helen Yu, Scott E. Martin, Laurenz van der Meer, Edward Yang, Sherry Lee, Wanting Xiong · 年份：2024 · DOI：10.1109/edtm58488.2024.10512266 · 被引用次数：1 · 研究领域：Industrial Vision Systems and Defect Detection、Manufacturing Process and Optimization、VLSI and Analog Circuit Testing

With highly competitive time-to-market and time-to-volume windows, IC suppliers need to be able to release new products to production (NPI) in a timely manner with competitive manufacturing metrics. Manufacturing yield, test time and quality are important metrics in NPI to manufacturing safe launch. A powerful yield management system is crucial to achieve the goal metrics. In this paper, recommended yield management system selection criteria, data integration methodology and innovative ways of using the selected yield management system to benefit safe launch efficiency are introduced. Three examples of using a cloud yield tool to expedite yield learning, test time reduction (TTR) and quality enhancement are presented.