Monolithic integration of perovskite heterojunction on TFT backplanes through vapor deposition for sensitive and stable x-ray imaging

作者：Liqi Li, Liting Tao, Lixiang Wang, Yuyang Li, Jiawen Li, Zhenyi Ni, Yanjun Fang, Deren Yang · 发表于：Science Advances · 年份：2024 · DOI：10.1126/sciadv.adj8659 · 被引用次数：45 · 研究领域：Perovskite Materials and Applications、Electronic and Structural Properties of Oxides、Advanced Semiconductor Detectors and Materials

Metal halide perovskites exhibit substantial potential for advancing next-generation x-ray detection. However, fabricating high-performance pixelated imaging arrays remains challenging due to the substantial dark current density and stability issues associated with common organic-inorganic hybrid perovskites. Here, we develop a vapor deposition method to create the first all-inorganic perovskite heterojunction film. The heterojunction introduction effectively reduces the dark current density of detectors to about 0.8 nA·cm −2 , satisfying thin-film transistor (TFT) integration standards, while also increases sensitivity to above 2.6 × 10 4 μC·Gy air −1 ·cm −2 , thus giving rise to a record low detection limit of <1 nGy air ·s −1 among all polycrystalline perovskite–based x-ray detectors. The devices also demonstrate remarkable stability across multifarious demanding working conditions. Last, through monolithic integration of the heterojunction film with a 64 × 64 pixelated TFT array, we have achieved high-resolution real-time x-ray imaging, which paves the way for the application of all-inorganic perovskite in low-dose flat-panel x-ray detection.