FPM-WSI: Fourier ptychographic whole slide imaging via feature-domain backdiffraction

作者：Shuhe Zhang, Aiye Wang, Jinghao Xu, Tianci Feng, Jinhua Zhou, An Pan · 发表于：Optica · 年份：2024 · DOI：10.1364/optica.517277 · 被引用次数：67 · 研究领域：Advanced X-ray Imaging Techniques、Digital Holography and Microscopy、Optical measurement and interference techniques

Fourier ptychographic microscopy (FPM) theoretically provides a solution to the trade-off between spatial resolution and field of view (FOV), and has promising prospects in digital pathology. However, block reconstruction and then stitching has become an unavoidable procedure for reconstruction of large FOV due to vignetting artifacts. This introduces digital stitching artifacts, as the existing image-domain optimization algorithms are highly sensitive to systematic errors. Such obstacles significantly impede the advancement and practical implementation of FPM, explaining why, despite a decade of development, FPM has not gained widespread recognition in the field of biomedicine. We report a feature-domain FPM (FD-FPM) based on the structure-aware forward model to realize stitching-free, full-FOV reconstruction. The loss function is uniquely formulated in the feature domain of images, which bypasses the troublesome vignetting effect and algorithmic vulnerability via feature-domain backdiffraction. Through massive simulations and experiments, we show that FD-FPM effectively eliminates vignetting artifacts for full-FOV reconstruction, and still achieves impressive reconstructions despite the presence of various systematic errors. We also found it has great potential in recovering the data with a lower spectrum overlapping rate, and in realizing digital refocusing without a prior defocus distance. With FD-FPM, we achieved full-color and high-throughput imaging (4.7 mm diameter FO...