Nanosecond laser damage of 532 nm thin film polarizers evaluated by different testing protocols

作者：X. Y. Liu, Feng Cao, Weili Zhang, Humbet Nasibli, Yuanan Zhao, Xiaofeng Liu, Kun Shuai, Jianda Shao · 发表于：Optical Materials · 年份：2024 · DOI：10.1016/j.optmat.2024.115124 · 被引用次数：8 · 研究领域：Laser Material Processing Techniques、Advanced Surface Polishing Techniques、Surface Roughness and Optical Measurements