Point-of-Care Testing (POCT) System based on self-Recovery Memoristor Chip with Low Energy Consuption(1.547 TOPS/W) and High Recognition (1142 fram/s)

作者：Xu Zheng, Lizhou Wu, Yixuan Liu, Qi-Qiao Wu, Yuanlu Xie, Yi Li, Jinru Lai, Wenxuan Sun, Danian Dong, Jie Yu, Xiaoxin Xu, Wenchang Zhang, Ming Liu · 年份：2023 · DOI：10.1109/iedm45741.2023.10413719 · 被引用次数：2 · 研究领域：CCD and CMOS Imaging Sensors、Cell Image Analysis Techniques、Image Processing Techniques and Applications

The Point-of-Care Testing (POCT) system based on image analysis suffers high power consumption, detection delay and lack of privacy security. In this work, we proposed an efficient POCT system based on memristor chip, which can support edge computing and realize real-time recognition of medical graphics. To solve the problem of the decrease of long-term inference accuracy caused by chip degradation, we designed the error correction and in-situ recovery module, which increased the recognition accuracy to 90% after 250 days. Benefit by the high speed and low power consumption of the memristor, the efficiency of POCT system is up to 1.547TOPS/W and the recognition rate is reach to 1142 frames/s.