Programmable Ferroelectricity in Hf 0.5 Zr 0.5 O 2 Enabled by Oxygen Defect Engineering

作者：Minghao Shao, Houfang Liu, Ri He, Xiaomei Li, Liang Wu, Ji Ma, Chen Ye, Xiangchen Hu, Ruiting Zhao, Zhicheng Zhong, Yi Yu, Caihua Wan, Yi Yang, Ce‐Wen Nan, Xuedong Bai, Tian‐Ling Ren, Xiao Renshaw Wang · 发表于：Nano Letters · 年份：2024 · DOI：10.1021/acs.nanolett.3c04104 · 被引用次数：14 · 研究领域：Ferroelectric and Negative Capacitance Devices、Electronic and Structural Properties of Oxides、Ferroelectric and Piezoelectric Materials

Ferroelectricity, especially the Si-compatible type recently observed in hafnia-based materials, is technologically useful for modern memory and logic applications, but it is challenging to differentiate intrinsic ferroelectric polarization from the polar phase and oxygen vacancy. Here, we report electrically controllable ferroelectricity in a Hf 0.5 Zr 0.5 O 2 -based heterostructure with Sr-doped LaMnO 3, a mixed ionic–electronic conductor, as an electrode. Electrically reversible extraction and insertion of an oxygen vacancy into Hf 0.5 Zr 0.5 O 2 are macroscopically characterized and atomically imaged in situ . Utilizing this reversible process, we achieved multilevel polarization states modulated by the electric field. Our study demonstrates the usefulness of the mixed conductor to repair, create, manipulate, and utilize advanced ferroelectric functionality. Furthermore, the programmed ferroelectric heterostructures with Si-compatible doped hafnia are desirable for the development of future ferroelectric electronics.