Remaining useful life prediction of circuit breaker operating mechanisms based on wavelet-enhanced dual-tree residual networks

作者：Tailong Wu, Yuan Yao, Zhihao Li, Binqiang Chen, Yue Wu, Weifang Sun · 发表于：Journal of Power Electronics · 年份：2023 · DOI：10.1007/s43236-023-00706-z · 被引用次数：8 · 研究领域：Power System Reliability and Maintenance、Machine Fault Diagnosis Techniques、Power Transformer Diagnostics and Insulation