Degradation-related defect level in weathered silicon heterojunction modules characterized by deep level transient spectroscopy

作者：Steve Johnston, Dirk Jordan, Dana B. Kern, Dylan J. Colvin, Kristopher O. Davis, Helio Moutinho, George F. Kroeger · 发表于：Solar Energy Materials and Solar Cells · 年份：2023 · DOI：10.1016/j.solmat.2023.112527 · 被引用次数：7 · 研究领域：Silicon and Solar Cell Technologies、Thin-Film Transistor Technologies、Photovoltaic System Optimization Techniques