AFFNet: An Attention-Based Feature-Fused Network for Surface Defect Segmentation

作者：Xiaodong Chen, Chong Fu, Ming Tie, Chiu‐Wing Sham, Hongfeng Ma · 发表于：Applied Sciences · 年份：2023 · DOI：10.3390/app13116428 · 被引用次数：13 · 研究领域：Industrial Vision Systems and Defect Detection、Welding Techniques and Residual Stresses、Non-Destructive Testing Techniques

Recently, deep learning methods have widely been employed for surface defect segmentation in industrial production with remarkable success. Nevertheless, accurate segmentation of various types of defects is still challenging due to their irregular appearance and low contrast with the background. In light of this challenge, we propose an attention-based network with a U-shaped structure, referred to as AFFNet. In the encoder part, we present a newly designed module, Residual-RepGhost-Dblock (RRD), which focuses on the extraction of more representative features using CA attention and dilated convolution with varying expansion rates without a concomitant increase in the parameters. In the decoder part, we introduce a novel global feature attention (GFA) module to selectively fuse low-level and high-level features, suppressing distracting information such as background. Moreover, considering the imbalance of the dataset sampled from actual industrial production and the difficulty of training samples with small defects, we use the online hard sample mining (OHEM) cross-entropy loss function to improve the learning ability of hard samples. Experimental results on the NEU-seg dataset demonstrate the superiority of our method over other state-of-the-art methods.