Data analysis in spectroscopic STXM

作者：Matthew A. Marcus · 发表于：Journal of Electron Spectroscopy and Related Phenomena · 年份：2023 · DOI：10.1016/j.elspec.2023.147310 · 被引用次数：34 · 研究领域：Electron and X-Ray Spectroscopy Techniques、Nuclear Physics and Applications、X-ray Diffraction in Crystallography

The typical output of a STXM (Scanning Transmission X-ray (spectro)Microscopy) measurement is a data cube consisting of a set of images (measurements of X-ray transmission at a grid of pixels) taken at a sequence of incident energies. As with any experimental measurement, this raw data must be reduced to some standard form and interpreted. In this paper, I review the basics of how to go from raw data to information about the sample. I will discuss the fundamentals of X-ray spectromicroscopy, data reduction, descriptive and model-based analysis, and available software, with examples taken from the literature.