Key process of the defection of PET buffer layer in XLPE power cable by a case study: Thermo-oxidative degradation

作者：Wenqing Zhou, Hao Cheng, Baojun Hui, Jiasheng Huang, Yanpeng Hao, Gang Liu, Licheng Li · 发表于：Engineering Failure Analysis · 年份：2023 · DOI：10.1016/j.engfailanal.2023.107131 · 被引用次数：31 · 研究领域：High voltage insulation and dielectric phenomena、Thermal Analysis in Power Transmission、Electrostatic Discharge in Electronics