Atom Probe Tomography for the Observation of Hydrogen in Materials: A Review

作者：Yi‐Sheng Chen, Pang-Yu Liu, Ranming Niu, Arun Devaraj, Hung‐Wei Yen, R.K.W. Marceau, Julie M. Cairney · 发表于：Microscopy and Microanalysis · 年份：2022 · DOI：10.1093/micmic/ozac005 · 被引用次数：69 · 研究领域：Advanced Materials Characterization Techniques、Hydrogen embrittlement and corrosion behaviors in metals、Metal and Thin Film Mechanics

Abstract Atom probe tomography (APT) is an emerging microscopy technique that has high sensitivity for hydrogen with sub-nanometre-scale spatial resolution, which makes it a unique method to investigate the atomic-scale distribution of hydrogen at interfaces and defects in materials. This article introduces the basics of APT-based hydrogen analysis, particularly the challenge of distinguishing a hydrogen background signal in APT by using hydrogen isotopes, along with strategies to yield high-quality analysis. This article also reviews several important findings on hydrogen distribution in a range of materials, including both structural alloys and functional materials, enabled by using APT. Limitations and future opportunities for hydrogen analysis by APT are also discussed.