MaMiNet: Memory-attended multi-inference network for surface-defect detection

作者：Xiaoyan Luo, Sen Li, Yu Wang, Tiancheng Zhan, Xiaofeng Shi, Bo Liu · 发表于：Computers in Industry · 年份：2022 · DOI：10.1016/j.compind.2022.103834 · 被引用次数：28 · 研究领域：Industrial Vision Systems and Defect Detection、Infrastructure Maintenance and Monitoring、Advanced Neural Network Applications