Resistance characteristics of CdZnTe films with structure of Cu/CdZnTe/ITO and Cu/CdZnTe/Cu

作者：Dongmei Zeng, Min Wu, Shuai Kong, Fan Nie · 发表于：Applied Physics A · 年份：2022 · DOI：10.1007/s00339-022-05266-w · 被引用次数：3 · 研究领域：Advanced Semiconductor Detectors and Materials、Chalcogenide Semiconductor Thin Films、Electronic and Structural Properties of Oxides