Radiation response of SiGe low noise amplifier irradiated with different energy protons

作者：Zhuoqi Li, Shuhuan Liu, Shuhuan Liu, Mathew Adefusika Adekoya, Xiaotang Ren, Jun Zhang, Shuangying Liu, Shuangying Liu, Long Li · 发表于：Microelectronics Reliability · 年份：2021 · DOI：10.1016/j.microrel.2021.114396 · 被引用次数：6 · 研究领域：Radio Frequency Integrated Circuit Design、Semiconductor materials and devices、Radiation Effects in Electronics