A Review on Recent Advances in Vision-based Defect Recognition towards Industrial Intelligence

作者：Yiping Gao, Xinyu Li, Xi Vincent Wang, Lihui Wang, Liang Gao · 发表于：Journal of Manufacturing Systems · 年份：2021 · DOI：10.1016/j.jmsy.2021.05.008 · 被引用次数：244 · 研究领域：Industrial Vision Systems and Defect Detection、Integrated Circuits and Semiconductor Failure Analysis、Manufacturing Process and Optimization