Deep learning-based fast recognition of commutator surface defects

作者：Yu Feng Shu, Bin Li, Xiaomian Li, Changwei Xiong, Shenyi Cao, Xin Wen · 发表于：Measurement · 年份：2021 · DOI：10.1016/j.measurement.2021.109324 · 被引用次数：36 · 研究领域：Industrial Vision Systems and Defect Detection、Advanced Neural Network Applications、Infrastructure Maintenance and Monitoring