Integrated correction of optical distortions for global HR-EBSD techniques

作者：Clément Ernould, Benoît Beausir, Jean‐Jacques Fundenberger, Vincent Taupin, Emmanuel Bouzy · 发表于：Ultramicroscopy · 年份：2020 · DOI：10.1016/j.ultramic.2020.113158 · 被引用次数：27 · 研究领域：Optical measurement and interference techniques、Advanced Measurement and Metrology Techniques、Advanced Vision and Imaging