An investigation of FinFET single-event latch-up characteristic and mitigation method

作者：Dongqing Li, Tianqi Liu, Zhenyu Wu, Chang Cai, Peixiong Zhao, Z. T. He, Jie Liu · 发表于：Microelectronics Reliability · 年份：2020 · DOI：10.1016/j.microrel.2020.113901 · 被引用次数：8 · 研究领域：Radiation Effects in Electronics、VLSI and Analog Circuit Testing、Advancements in Semiconductor Devices and Circuit Design